A Simple Fault Diagnosis Method for Analog Parts of Electronic Embedded Systems

− A new simple method of single soft fault detection and localization of analog parts in embedded electronic systems controlled by microcontrollers is presented. In the pre-testing stage of the method a fault dictionary is created based on the map of localization curves. In the measurement stage the time response to a stimulating square impulse of the analog part is applied to the input of the analog comparator, and measurements of duration times of subsequent impulses of output signals of the analog comparator are realized by the internal timer of the microcontroller. In the last stage, fault detection and localization are performed by the microcontroller. The main advantage and novelty of the method is the fact that the BIST consists only of one analog comparator and two timers of the microcontroller already mounted in the system. Hence, this approach simplifies the structure and design of BISTs, which allows to decrease test costs.